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dws (341)

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Journal of dws (341)

Friday April 18, 2003
10:54 PM

Accidental stress tests

[ #11732 ]
In one accidental test today, a 64Mb Lexar "JumpDrive" USB keychain survived a trip through the washer (with fabric softener) and the drier, without any detectable loss of bits.

Another test, on the impact resistance of a Dell Insprion laptop with a Bobby Sox aluminum baseball bat, was narrowly avoided.

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